X-Ray Fluorescence Analysis (XRF) is a nondestructive physical method used for chemical elemental analysis of materials in the solid or liquid state. The specimen is irradiated by photons or charged particles of sufficient energy to cause its elements to emit (fluoresce) their characteristic x-ray line spectra.The detection system allows determining energies of the emission lines and their intensities. Elements in a specimen are identified by their spectral line energies or wavelengths for qualitative analysis, and intensities are related to concentrations of elements providing opportunity for quantitative analysis. Computers are widely used in this field, both for automated data collection and for reducing the x-ray data to weight-percent and atomic-percent chemical composition or area-related mass.
Each of the elements present in a sample produces a unique set of characteristic x-rays that is a “fingerprint” for that specific element. XRF analyzers determine the chemistry of a sample by measuring the spectrum of the characteristic x-ray emitted by the different elements in the sample when it is illuminated by x-rays. These x-rays are emitted either from an x-ray tube.
A fluorescent x-ray is created when an x-ray of sufficient energy strikes an atom in the sample, dislodging an electron from one of the atom’s inner orbital shells.
The atom regains stability, filling the vacancy left in the inner orbital shell with an electron from one of the atom’s higher energy orbital shells.
The electron drops to the lower energy state by releasing a fluorescent x-ray, and the energy of this x-ray is equal to the specific difference in energy between two quantum states of the electron.
When a sample is measured using XRF, each element present in the sample emits its own unique fluorescent x-ray energy spectrum. By simultaneously measuring the fluorescent x-rays emitted by the different elements in the sample, the instrument can determine those elements present in the sample and their relative concentrations – in other words, the elemental chemistry of the sample. For samples with specifically defined chemical composition, such as common grades of metal alloys, these XRF instruments also identify most sample types by name, typically in seconds.
Screening Analysis: Samples are screened for elements of interest using a portable XRF analyzer. Rapidly screen hundreds of sample to obtain indicative concentrations of elements to allow fast decision making. Very useful for identifying samples with increased exploration potential.
Trace Element Analysis: Sample is prepared as a pressed pellet and analyzed for Trace elements. Results in parts per million (ppm).
Major Element Analysis: Sample is generally fused and analyzed for major elements. Results in oxide weight %.
Loss on Ignition (LOI): Sample is thermo gravimetrically analyzed to determine amount of moisture or impurities lost when heated to 1000°C.
X-Ray fluorescence is used in a wide range of applications, including
– Research in Igneous, Sedimentary and Metamorphic Petrology
– Soil Surveys
– Mining (e.g., Measuring the Grade of Ore)
– Cement Production
– Ceramic and Glass Manufacturing
– Metallurgy (e.g., Quality Control)
– Environmental Studies (e.g., Analyses of Particulate Matter on Air Filters)
– Petroleum Industry (e.g., Sulfur Content of Crude Oils and Petroleum Products)
– Field Analysis in Geological and Environmental Studies (Using Portable, Hand-held XRF Spectrometers)
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